High resolution electron energy loss spectroscopy of MnO(100) and oxidized MnO(100)
نویسندگان
چکیده
منابع مشابه
High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy.
An all-magnetic monochromator/spectrometer system for sub-30 meV energy-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope is described. It will link the energy being selected by the monochromator to the energy being analysed by the spectrometer, without resorting to decelerating the electron beam. This will allow it to attain spectral energy stability...
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The high beam current and subangstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopy (EELS) mapping with atomic resolution. These spectral maps are often dose limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage o...
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We review the principles of high resolution electron energy loss spectroscopy (HREELS) and of its extensions to time, momentum and spin resolved domains. The principles of the construction design and of some results are reported and discussed. In particular, we review the different scattering mechanisms by showing paradigmatic examples of their application. Advantages and shortcomings of HREELS...
متن کاملHigh-resolution electron energy loss spectroscopy study of O-Cu(410).
We have investigated oxygen adsorption on Cu(410) by high-resolution electron energy loss spectroscopy, dosing O2 with a supersonic molecular beam at different surface temperatures and for different angles of incidence and beam energies or by backfilling. In the investigated crystal temperature range (127 < T < 570 K), adsorption is always dissociative. Depending on T, impact energy, and angle ...
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ژورنال
عنوان ژورنال: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
سال: 1996
ISSN: 0734-2101,1520-8559
DOI: 10.1116/1.580314